We have components & subsystems that could be used to complement your existing inspection systems to enhance their functionalities and improve operability for different testing requirements.
Auto loading and unloading stacked lead frame/substrate inside X-Ray machine to facilitate visual or vision inspection by auto XY indexing,
- XRL1000-sm (Slotted LEAD FRAME AUTO LOADER)
Auto loading and unloading slotted lead frame/substrate inside X-Ray machine to facilitate visual or vision inspection by auto XY indexing,
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Optical Subsystem & Accessories
- TDR100 (3D ANGLING ROTATOR)
Accessory for optical system (i.e. microscope) allow side and top view rotating in 360°, with built-in LED light, or optional Ring Light for brighter and clearer image
Marking defect in materials such as wafer, substrate, lead frame with standard electric activated ink cartridges. Ideal use during optical inspection
- INK500
(inker system)
Marking defect in materials such as wafer, substrate, lead frame with convertible electric activated or pneumatic activated ink cartridges. Ideal use during optical inspection
- PNC100 (PUNCHER FOR REJECT IDENTIFICATION)
Ideal use for devices in tape reel under X-Ray inspection. Marking defects by punching soft and tiny hole for permanent reject identifications